Single event transient propagation through digital optocouplers

被引：3
|
作者：
Adell, PC
Mion, O
Schrimpf, RD
Chatry, C
Calvel, P
Melotte, MR
机构：
[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA
[2] Alcatel Space, F-06156 Cannes La Bocca, France
[3] TRAD, F-31319 Labege, France
[4] Alcatel Space, F-31037 Toulouse, France
[5] Alcatel ETCA, B-6000 Charleroi, Belgium
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 04期
关键词：
analog single event transients (SETs); opto-couplers; radiation hardness assurance; SET propagation;
D O I：
10.1109/TNS.2005.851746
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new approach for assessing the risk of upsetting digital optocouplers due to the propagation of single event transients (SETs) is proposed. The optocoupler's input current (I-f) and propagation time (t(pHL)) are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semiconductor LM139 is detailed to validate the concept.
引用
收藏
页码：1136 / 1139
页数：4
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