共 50 条
- [21] Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era 2023 IEEE 41ST VLSI TEST SYMPOSIUM, VTS, 2023,
- [23] Corner effects in double-gate/gate-all-around MOSFETs CHINESE PHYSICS, 2007, 16 (03): : 812 - 816
- [24] SiGe Gate-All-around Nanosheet Reliability 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2022,
- [29] From gate-all-around to nanowire MOSFETs CAS 2007 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2007, : 11 - 17
- [30] Germanium Gate-All-Around pFETs on SOI SIGE, GE, AND RELATED COMPOUNDS 5: MATERIALS, PROCESSING, AND DEVICES, 2012, 50 (09): : 31 - 37