DEEP DEFECT STATES IN EVAPORATED HETEROEPITAXIAL SILICON FILMS

被引：0

作者：

ECKE, W ^{[1
]}

LEBEDEV, AA ^{[1
]}

MAMADALIMOV, AT ^{[1
]}

机构：

[1] AF IOFFE ENGN PHYS INST,LENINGRAD,USSR

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 47卷 / 02期

关键词：

D O I：

10.1002/pssa.2210470221

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：507 / 512

页数：6

共 50 条

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