DEEP DEFECT STATES IN EVAPORATED HETEROEPITAXIAL SILICON FILMS

被引：0
|
作者：
ECKE, W [1 ]
LEBEDEV, AA [1 ]
MAMADALIMOV, AT [1 ]
机构：
[1] AF IOFFE ENGN PHYS INST,LENINGRAD,USSR
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1978年 / 47卷 / 02期
关键词：
D O I：
10.1002/pssa.2210470221
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：507 / 512
页数：6
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