ELECTRON BOMBARDMENT DAMAGE IN SILICON ESAKI DIODES

被引：15

|

作者：

LOGAN, RA

GILBERT, JF

AUGUSTYNIAK, WM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1961年 / 32卷 / 07期

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D O I：

10.1063/1.1736205

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1201 / &

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