ELECTRON BOMBARDMENT DAMAGE IN SILICON ESAKI DIODES

被引：15
|
作者：
LOGAN, RA
GILBERT, JF
AUGUSTYNIAK, WM
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1961年 / 32卷 / 07期
关键词：
D O I：
10.1063/1.1736205
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：1201 / &
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