AN AUTOMATIC VISUAL INSPECTION SYSTEM FOR INTEGRATED-CIRCUIT CHIPS

被引：8
|
作者：
HSIEH, YY
FU, KS
机构：
来源：
COMPUTER GRAPHICS AND IMAGE PROCESSING | 1980年 / 14卷 / 04期
关键词：
D O I：
10.1016/0146-664X(80)90024-6
中图分类号：
TP31 [计算机软件];
学科分类号：
081202 ; 0835 ;
摘要：
引用
收藏
页码：293 / 343
页数：51
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