AN AUTOMATIC VISUAL INSPECTION SYSTEM FOR INTEGRATED-CIRCUIT CHIPS

被引：8

|

作者：

HSIEH, YY

FU, KS

机构：

来源：

COMPUTER GRAPHICS AND IMAGE PROCESSING | 1980年 / 14卷 / 04期

关键词：

D O I：

10.1016/0146-664X(80)90024-6

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

引用

收藏

页码：293 / 343

页数：51

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