INFORMATION MANAGEMENT-SYSTEM FOR INTEGRATED-CIRCUIT DEVICES

被引：1

作者：

BARRETT, WA ^{[1
]}

机构：

[1] HEWLETT PACKARD CO,DIV DATA,CUPERTINO,CA 95014

来源：

IEEE TRANSACTIONS ON ENGINEERING MANAGEMENT | 1976年 / 23卷 / 04期

关键词：

DATA BASE SYSTEMS - Applications - DATA STORAGE; SEMICONDUCTOR - Storage Devices;

D O I：

10.1109/TEM.1976.6447181

中图分类号：

F [经济];

学科分类号：

02 ;

摘要：

A data-base management system (DMS) has been applied to the management of test results in the development of an integrated-circuit (IC) memory device. The system software is largely independent of the specific device tested and can be applied to any IC device that can be characterized by chips within slices within lots. Several sets of parametric and go-nogo test sequences can be maintained simultaneously. Changes in the tests can be made with no change in the reporting software or the data-base structure. Only one program need be changed when an entry system format is changed.

引用

页码：147 / 152

页数：6

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