ANALYTICAL APPROACH OF UNDETECTABLE BRIDGING FAULTS IN COMBINATIONAL CIRCUITS

Physical faults include bridging faults, break (open) faults, transistor stuckon and transistor stuck-off. Compared to traditional gate-level stuck-at faults, physical faults more closely represent realistic faults appearing at the gate level and transistor level. Analytical modeling for such faults, used for design and testability, is still a new and emerging area. Undetectable bridging faults belong to hard to detect faults class and can invalidate several sets of tests designed for classical stuck-at faults. This work defines an analytical characterization for undetectable bridging faults using discrete analysis mathematical approach.