ANALYTICAL APPROACH OF UNDETECTABLE BRIDGING FAULTS IN COMBINATIONAL CIRCUITS

被引：0

作者：

Bucur, I. I. ^{[1
]}

机构：

[1] Univ Politehn Bucuresti, Dept Comp Sci, Bucharest, Romania

来源：

UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN SERIES C-ELECTRICAL ENGINEERING AND COMPUTER SCIENCE | 2006年 / 68卷 / 03期

关键词：

bridge defects; bridging fault models; resistive bridging faults; fault simulation; undetectable bridging faults; multiple bridging faults; stuck-at faults; induced wired-AND; induced wired-OR; nMOS circuits; TTL; Boolean differential calculus; exclusive; disjunctive expansion; discrete Taylor expansion;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Physical faults include bridging faults, break (open) faults, transistor stuckon and transistor stuck-off. Compared to traditional gate-level stuck-at faults, physical faults more closely represent realistic faults appearing at the gate level and transistor level. Analytical modeling for such faults, used for design and testability, is still a new and emerging area. Undetectable bridging faults belong to hard to detect faults class and can invalidate several sets of tests designed for classical stuck-at faults. This work defines an analytical characterization for undetectable bridging faults using discrete analysis mathematical approach.

引用

页码：63 / 74

页数：12

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