EFFECT OF MINORITY CARRIER TRAPPING ON LOW-TEMPERATURE CHARACTERISTICS OF SI TRANSISTORS

被引：12
|
作者：
DUMKE, WP
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1970年 / ED17卷 / 04期
关键词：
D O I：
10.1109/T-ED.1970.16992
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：388 / &
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