EFFECT OF MINORITY CARRIER TRAPPING ON LOW-TEMPERATURE CHARACTERISTICS OF SI TRANSISTORS

被引：12
|
作者：
DUMKE, WP
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1970年 / ED17卷 / 04期
关键词：
D O I：
10.1109/T-ED.1970.16992
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：388 / &
相关论文
共 50 条
  • [41] Hysteresis Characteristics in Low Temperature Poly-Si Thin Film Transistors
    Chung, Hoon-Ju
    Kim, Dae-Hwan
    Kim, Byeong-Koo
    JOURNAL OF INFORMATION DISPLAY, 2005, 6 (04) : 6 - 10
  • [42] LOW-TEMPERATURE POSITRON TRAPPING INTO VOIDS IN METALS
    JENSEN, KO
    WALKER, AB
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1992, 4 (08) : 1973 - 1980
  • [43] LOW-TEMPERATURE TRAPPING OF POSITIVE MUONS IN METALS
    CRAIG, BI
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1983, 120 (02): : K211 - K214
  • [44] Effect of Low-Temperature on Endurance Characteristics of SONOS Memory
    Liu, Lijuan
    Shen, Guofei
    Cao, Gang
    Zhang, Shunbin
    Shi, Yanling
    CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2013 (CSTIC 2013), 2013, 52 (01): : 959 - 964
  • [45] EFFECT OF CURRENT ON THE LOW-TEMPERATURE CHARACTERISTICS OF DIODE SENSORS
    CHOPRA, V
    DHARMADURAI, G
    CRYOGENICS, 1980, 20 (11) : 659 - 662
  • [46] Oxide Thinning and Structure Scaling Down Effect of Low-Temperature Poly-Si Thin-Film Transistors
    Ma, William Cheng-Yu
    Chiang, Tsung-Yu
    Lin, Je-Wei
    Chao, Tien-Sheng
    JOURNAL OF DISPLAY TECHNOLOGY, 2012, 8 (01): : 12 - 17
  • [47] Compliant effect of low-temperature Si buffer for SiGe growth
    Luo, YH
    Wan, J
    Forrest, RL
    Liu, JL
    Jin, G
    Goorsky, MS
    Wang, KL
    APPLIED PHYSICS LETTERS, 2001, 78 (04) : 454 - 456
  • [48] Thin-Film Heterojunction Field-Effect Transistors With Crystalline Si Channels and Low-Temperature PECVD Contacts
    Hekmatshoar, Bahman
    IEEE ELECTRON DEVICE LETTERS, 2014, 35 (01) : 81 - 83
  • [49] Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors
    Zhu, Hui
    Fang, Zhixuan
    Xie, Na
    Huang, Zeng
    Liu, Zheng
    Li, Dong
    Feng, Shiwei
    Guo, Chunsheng
    Zhang, Yamin
    Zhou, Lixing
    Liu, Bo
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (09) : 4924 - 4929
  • [50] Low-temperature electrical characterization of junctionless transistors
    Jeon, Dae-Young
    Park, So Jeong
    Mouis, Mireille
    Barraud, Sylvain
    Kim, Gyu-Tae
    Ghibaudo, Gerard
    SOLID-STATE ELECTRONICS, 2013, 80 : 135 - 141
12345