Stuck-at fault detection, controllability and observability functions of the combinational circuit gate pole

被引：0

作者：

Golubeva, Olga, I ^{[1
]}

机构：

[1] Tomsk State Univ, Tomsk, Russia

来源：

VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE | 2015年 / 30卷 / 01期

关键词：

combinational circuit; stuck-at fault; test patterns; observability; BDD; orthogonal DNF;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：77 / 86

页数：10

共 47 条

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