共 50 条
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- [4] THE INVESTIGATION OF POINT-DEFECTS IN GALLIUM-ARSENIDE DOPED WITH ISOVALENT IMPURITIES KRISTALLOGRAFIYA, 1982, 27 (06): : 1140 - 1142
- [7] DEFECTS AND DIFFUSION IN SILICON, GERMANIUM, AND GALLIUM-ARSENIDE JOURNAL OF METALS, 1987, 39 (07): : A6 - A6
- [8] MELT DEPTH AND REGROWTH KINETICS IN PULSED LASER ANNEALING OF SILICON AND GALLIUM-ARSENIDE PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 385 : 38 - 43
- [9] CALCULATION OF THE CONCENTRATION CHANGES OF INTRINSIC POINT-DEFECTS IN GALLIUM-ARSENIDE DOPED WITH ISOVALENT INDIUM AND ANTIMONY KRISTALLOGRAFIYA, 1989, 34 (02): : 520 - 523