STRUCTURAL DEFECTS IN SILICON EPITAXIAL-FILMS AND THEIR INFLUENCE ON ELECTRICAL-PROPERTIES OF PLANAR DIFFUSED P-N-JUNCTIONS

被引：0
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作者：
ISKENDERZADE, ZA
MILLER, YG
RZAYEV, SG
JAFAROVA, EA
AKHUNDOV, MR
机构：
来源：
IZVESTIYA AKADEMII NAUK AZERBAIDZHANSKOI SSR SERIYA FIZIKO-TEKHNICHESKIKH I MATEMATICHESKIKH NAUK | 1977年 / 04期
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中图分类号：
O1 [数学];
学科分类号：
0701 ; 070101 ;
摘要：
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页码：76 / 83
页数：8
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