STRUCTURAL DEFECTS IN SILICON EPITAXIAL-FILMS AND THEIR INFLUENCE ON ELECTRICAL-PROPERTIES OF PLANAR DIFFUSED P-N-JUNCTIONS

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ISKENDERZADE, ZA
MILLER, YG
RZAYEV, SG
JAFAROVA, EA
AKHUNDOV, MR
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O1 [数学];
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0701 ; 070101 ;
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页码:76 / 83
页数:8
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