INTERFACIAL PROPERTIES OF METAL-SILICON OXIDE-METAL STRUCTURES IN RELATION TO THE NONSTOICHIOMETRY OF A THIN-FILM DIELECTRIC

被引：3
|
作者：
PISARKIEWICZ, T
机构：
来源：
THIN SOLID FILMS | 1980年 / 67卷 / 01期
关键词：
D O I：
10.1016/0040-6090(80)90286-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：49 / 55
页数：7
相关论文
共 50 条
  • [21] AMORPHOUS-SILICON THIN-FILM METAL-OXIDE-SEMICONDUCTOR TRANSISTORS
    HAYAMA, H
    MATSUMURA, M
    APPLIED PHYSICS LETTERS, 1980, 36 (09) : 754 - 755
  • [22] THIN-FILM REFLECTIVITY IN DIELECTRIC-METAL BILAYERS
    HOLLINGSWORTH, P
    GUREV, HS
    SARI, SO
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (10) : 1070 - 1070
  • [23] PIEZOELECTRET EFFECT ON METAL-CDTE-METAL THIN-FILM STRUCTURES
    VALENTOVIC, D
    CERVENAK, J
    THIN SOLID FILMS, 1986, 137 (01) : 17 - 25
  • [24] PHOTODIELECTRIC EFFECT IN THIN-FILM METAL-CDTE-METAL STRUCTURES
    KNEPPO, I
    CERVENAK, J
    SOLID-STATE ELECTRONICS, 1972, 15 (05) : 587 - &
  • [25] Mechanism of phase formation in thin-film metal-oxide-metal structures with oxides of transition metals
    Odynets, LL
    Pergament, AL
    Stefanovich, GB
    Chudnovskii, FA
    FIZIKA TVERDOGO TELA, 1995, 37 (07): : 2215 - 2218
  • [26] OPTICAL DETECTION IN THIN-FILM METAL-OXIDE-METAL DIODES
    GUSTAFSO.TK
    SCHMIDT, RV
    PERUCCA, JR
    APPLIED PHYSICS LETTERS, 1974, 24 (12) : 620 - 622
  • [27] THIN-FILM METAL BASE TRANSISTOR WITH AMORPHOUS SILICON
    DENEUVILLE, A
    BRODSKY, MH
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 247 - 247
  • [28] ON THE NATURE OF THE FORMING PROCESS OF THE METAL-DIELECTRIC-METAL THIN-FILM SYSTEM
    VOROBYEV, GA
    RADIOTEKHNIKA I ELEKTRONIKA, 1981, 26 (03): : 655 - 656
  • [29] Contributions to Dielectric Constant Enhancement in Thin-Film Metal-Insulator-Metal
    Krueger, D. S.
    Legenzoff, Z. J.
    Wolf, J. A.
    Claypool, J. B.
    Schwartz, R. W.
    Huebner, W.
    JOURNAL OF CERAMIC SCIENCE AND TECHNOLOGY, 2022, 13 (01): : 1 - 8
  • [30] INFLUENCE OF NONUNIFORM THICKNESS OF OXIDE INTERFACIAL LAYER ON BARRIER HEIGHT OF A METAL-SILICON CONTACT
    BARRET, C
    LEBARS, P
    VAPAILLE, A
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1975, 280 (06): : 133 - 136
12345