INTEGRATING PHOTOMETRIC ROTATING ANALYZER ELLIPSOMETER WITH PRECISION ESTIMATION FROM ONE ANALYZER REVOLUTION

被引：0
|
作者：
WEBER, EH [1 ]
机构：
[1] AKAD WISSENSCH DDR,ZENT INST ELEKR PHYS,DDR-102 BERLIN,GER DEM REP
来源：
OPTIK | 1977年 / 49卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：365 / 372
页数：8
相关论文
共 50 条
  • [31] Effect of the orientation of the fixed analyzer on the ellipsometric parameters in rotating polarizer and compensator ellipsometer with speed ratio 1:1
    Anas A. Alkanoo
    Sofyan A. Taya
    Taher M. El-Agez
    Optical and Quantum Electronics, 2015, 47 : 2039 - 2053
  • [32] Effect of the orientation of the fixed analyzer on the ellipsometric parameters in rotating polarizer and compensator ellipsometer with speed ratio 1:1
    Alkanoo, Anas A.
    Taya, Sofyan A.
    El-Agez, Taher M.
    OPTICAL AND QUANTUM ELECTRONICS, 2015, 47 (07) : 2039 - 2053
  • [33] POST-CALIBRATION CORRECTION FOR A ROTATING-ANALYZER ELLIPSOMETER WITH AN OPTICAL-FIBER BUNDLE DETECTION SYSTEM
    KIM, SY
    SPANOS, L
    IRENE, EA
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1995, 28 (04) : 420 - 425
  • [34] A ONE-WAVELENGTH, INSITU ALIGNMENT METHOD FOR ROTATING ANALYZER ELLIPSOMETERS
    WIJERS, C
    APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1982, 27 (01): : 5 - 8
  • [35] Lock-in amplifier-based rotating-analyzer spectroscopic ellipsometer with micro-controlled angular frequency
    Flores-Camacho, JM
    Núñez-Olvera, OF
    Rodríguez-Pedroza, G
    Martínez, AL
    Lastras-Martínez, LF
    REVISTA MEXICANA DE FISICA, 2005, 51 (03) : 274 - 283
  • [36] Optical properties of CuInSe2 bulk material characterized by a fixed polarizer-rotating analyzer spectroscopic ellipsometer
    Hidalgo, HL
    Lachab, M
    Zouaoui, A
    Alhamed, M
    Llinares, C
    Peyrade, JP
    Galibert, J
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1997, 200 (01): : 297 - 305
  • [37] Evaluation of errors in determining the refractive index and thickness of thin SiO2 films using a rotating analyzer ellipsometer
    Rev Sci Instrum, 11 (5277):
  • [38] Fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometer: accurate calibration method, effect of errors and testing
    Naciri, AE
    Broch, L
    Johann, L
    Kleim, R
    THIN SOLID FILMS, 2002, 406 (1-2) : 103 - 112
  • [39] AN EVALUATION OF ERRORS IN DETERMINING THE REFRACTIVE-INDEX AND THICKNESS OF THIN SIO2-FILMS USING A ROTATING ANALYZER ELLIPSOMETER
    KIM, SY
    IRENE, EA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (11): : 5277 - 5281
  • [40] DEPOLARIZATION OF GASES FROM ROTATING ANALYZER MEASUREMENTS AND A RATIO METHOD OF ANALYSIS
    ROWELL, RL
    BARRETT, JJ
    AVAL, GM
    WATSON, R
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1971, (NSEP): : 6 - &
12345