Optical properties of CuInSe2 bulk material characterized by a fixed polarizer-rotating analyzer spectroscopic ellipsometer

被引：0

作者：

Hidalgo, HL ^{[1
]}

Lachab, M ^{[1
]}

Zouaoui, A ^{[1
]}

Alhamed, M ^{[1
]}

Llinares, C ^{[1
]}

Peyrade, JP ^{[1
]}

Galibert, J ^{[1
]}

机构：

[1] INST NATL SCI APPL,DEPT PHYS,PHYS SOLIDES LAB,F-31077 TOULOUSE,FRANCE

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1997年 / 200卷 / 01期

关键词：

D O I：

10.1002/1521-3951(199703)200:1<297::AID-PSSB297>3.0.CO;2-C

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

In the present paper, we have investigated the optical properties of CuInSe2 single and polycrystals using a broad band fixed polarizer-rotating analyzer spectroscopic ellipsometer (RAE) in the spectral range 250 to 1700 nm. The wavelength dependence of CuInSe2 optical constants was studied assuming a two-phase system: the ambient medium and the sample. We have determined interband transition energies near and above the bandgap bs a detailed analysis of the absorption spectrum and through the third joint-density-of-states (JDOS) derivative computation. Measurements were carried out on nearby-stoichiometric and In-rich CulnSe2 substrates.

引用

页码：297 / 305

页数：9

共 4 条

[1] Fixed polarizer, rotating-polarizer and fixed analyzer spectroscopic ellipsometer: accurate calibration method, effect of errors and testing
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[3] Effect of Cu deficiency on the optical properties and electronic structure of CuInSe2 and CuIn0.8Ga0.2Se2 determined by spectroscopic ellipsometry
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[4] Optical properties of SrBi2(Ta1-xNbx)2O9 bulk ceramics characterized by spectroscopic ellipsometry
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PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1998, 167 (01): : 215 - 221

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