PHOTOELECTRON HOLOGRAPHY OF PB/SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-BETA

被引：15
|
作者：
ROESLER, JM
SIEGER, MT
MILLER, T
CHIANG, TC
机构：
[1] UNIV ILLINOIS, DEPT PHYS, URBANA, IL 61801 USA
[2] UNIV ILLINOIS, FREDERICK SEITZ MAT RES LAB, URBANA, IL 61801 USA
来源：
SURFACE SCIENCE | 1995年 / 329卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
ADATOMS; ANGLE RESOLVED PHOTOEMISSION; LEAD; PHOTOELECTRON HOLOGRAPHY; SILICON; SINGLE CRYSTAL SURFACES; SOFT X-RAY PHOTOELECTRON SPECTROSCOPY; SURFACE STRUCTURE;
D O I：
10.1016/0039-6028(95)00232-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The technique of holographic image reconstruction based on photoelectron detection has been applied to the Pb/Si(111)-(root 3 X root 3)R30 degrees-beta phase for a determination of the surface structure. Angle-resolved photoemission from the Pb5d core level shows intensity oscillations as a function of photon energy. These constant-initial-state spectra were taken at various emission angles and Fourier inverted to yield three-dimensional real-space images of the nearest neighbors to the emitter atom. These images clearly show Pb atoms adsorbed at the T-4, site.
引用
收藏
页码：L588 / L592
页数：5
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