PHOTOELECTRON HOLOGRAPHY OF PB/SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-BETA

被引：15
|
作者：
ROESLER, JM
SIEGER, MT
MILLER, T
CHIANG, TC
机构：
[1] UNIV ILLINOIS, DEPT PHYS, URBANA, IL 61801 USA
[2] UNIV ILLINOIS, FREDERICK SEITZ MAT RES LAB, URBANA, IL 61801 USA
来源：
SURFACE SCIENCE | 1995年 / 329卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
ADATOMS; ANGLE RESOLVED PHOTOEMISSION; LEAD; PHOTOELECTRON HOLOGRAPHY; SILICON; SINGLE CRYSTAL SURFACES; SOFT X-RAY PHOTOELECTRON SPECTROSCOPY; SURFACE STRUCTURE;
D O I：
10.1016/0039-6028(95)00232-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The technique of holographic image reconstruction based on photoelectron detection has been applied to the Pb/Si(111)-(root 3 X root 3)R30 degrees-beta phase for a determination of the surface structure. Angle-resolved photoemission from the Pb5d core level shows intensity oscillations as a function of photon energy. These constant-initial-state spectra were taken at various emission angles and Fourier inverted to yield three-dimensional real-space images of the nearest neighbors to the emitter atom. These images clearly show Pb atoms adsorbed at the T-4, site.
引用
收藏
页码：L588 / L592
页数：5
相关论文
共 50 条
  • [1] ROCKING-CURVE ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION FROM THE SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-AL, SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-GA, AND SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-IN SURFACE
    HANADA, T
    DAIMON, H
    INO, S
    PHYSICAL REVIEW B, 1995, 51 (19): : 13320 - 13325
  • [2] HIGH-RESOLUTION PHOTOELECTRON-SPECTROSCOPY STUDY OF (ROOT-3X-ROOT-3) R30-DEGREES-AG ON SI(111)
    HERMAN, GS
    WOICIK, JC
    ANDREWS, AB
    ERSKINE, JL
    SURFACE SCIENCE, 1993, 290 (1-2) : L643 - L648
  • [3] DOMAIN-WALL STRUCTURE OF SI(111) (ROOT-3X-ROOT-3) R30-DEGREES-AU
    FALTA, J
    HILLE, A
    NOVIKOV, D
    MATERLIK, G
    SEEHOFER, L
    FALKENBERG, G
    JOHNSON, RL
    SURFACE SCIENCE, 1995, 330 (02) : L673 - L677
  • [4] ATOMIC-STRUCTURE OF THE SI(111)(ROOT-3X-ROOT-3)R 30-DEGREES-AG SURFACE
    JIA, JF
    ZHAO, RG
    YANG, WS
    PHYSICAL REVIEW B, 1993, 48 (24): : 18109 - 18113
  • [5] GEOMETRY OF THE GE(111)-AU(ROOT-3X-ROOT-3)R 30-DEGREES RECONSTRUCTION
    GOTHELID, M
    HAMMAR, M
    BJORKQVIST, M
    KARLSSON, UO
    FLODSTROM, SA
    WIGREN, C
    LELAY, G
    PHYSICAL REVIEW B, 1994, 50 (07): : 4470 - 4475
  • [6] AN X-RAY-DIFFRACTION STUDY OF THE SI(111)(ROOT-3X-ROOT-3)R30-DEGREES INDIUM RECONSTRUCTION
    FINNEY, MS
    NORRIS, C
    HOWES, PB
    VANSILFHOUT, RG
    CLARK, GF
    THORNTON, JMC
    SURFACE SCIENCE, 1993, 291 (1-2) : 99 - 109
  • [7] A SCANNED-ANGLE AND SCANNED-ENERGY PHOTOELECTRON DIFFRACTION STUDY OF (ROOT-3X-ROOT-3)R30-DEGREES AG ON SI(111)
    HERMAN, GS
    BULLOCK, EL
    YAMADA, M
    KADUWELA, AP
    FRIEDMAN, DJ
    THEVUTHASAN, S
    KIM, YJ
    TRAN, TT
    FADLEY, CS
    LINDNER, T
    RICKEN, DE
    ROBINSON, AW
    BRADSHAW, AM
    SURFACE SCIENCE, 1993, 284 (1-2) : 23 - 52
  • [8] STRUCTURE OF AL(111)-(ROOT-3X-ROOT-3)R 30-DEGREES-NA - A LEED STUDY
    BURCHHARDT, J
    NIELSEN, MM
    ADAMS, DL
    LUNDGREN, E
    ANDERSEN, JN
    PHYSICAL REVIEW B, 1994, 50 (07): : 4718 - 4724
  • [9] SURFACE ELECTRONIC-STRUCTURE OF EPITAXIAL ROOT-3X-ROOT-3 R30-DEGREES ER SILICIDE ON SI(111)
    SAINTENOY, S
    WETZEL, P
    PIRRI, C
    BOLMONT, D
    GEWINNER, G
    SURFACE SCIENCE, 1995, 331 : 546 - 551
  • [10] Holography with Kikuchi electrons: Direct imaging of ordered trimers on Au/Si(111)(root 3x root 3)R30 degrees and Sb/Si(111)(root 3x root 3)R30 degrees interfaces
    Hong, IH
    Jih, MC
    Chou, YC
    Wei, CM
    SURFACE REVIEW AND LETTERS, 1997, 4 (04) : 733 - 756
12345