SCREENED IMPURITY SCATTERING IN HEAVILY DOPED COVALENT SEMICONDUCTORS

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作者：

ROWE, DM

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来源：

ELECTRONICS LETTERS | 1971年 / 7卷 / 26期

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D O I：

10.1049/el:19710521

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：763 / &

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