共 50 条
- [1] P/N JUNCTION LOCALIZATION IN INTEGRATED-CIRCUITS WITH SCANNING ELECTRON-MICROSCOPE INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 65 - 66
- [2] P/N JUNCTION LOCALIZATION IN INTEGRATED-CIRCUITS WITH SCANNING ELECTRON-MICROSCOPE EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 65 - 66
- [3] SCANNING ELECTRON-MICROSCOPE EXAMINES FINE-LINE INTEGRATED-CIRCUITS ELECTRONICS, 1979, 52 (26): : 62 - &
- [5] SIMULATION OF SECONDARY-ELECTRON TRAJECTORIES FOR TESTING THE INTEGRATED-CIRCUITS WITH SCANNING ELECTRON-MICROSCOPE JOURNAL DE PHYSIQUE III, 1992, 2 (11): : 2155 - 2163
- [8] ELECTRON AND OPTICAL BEAM TESTING OF INTEGRATED-CIRCUITS REVUE DE PHYSIQUE APPLIQUEE, 1989, 24 (06): : 129 - 143
- [9] SCANNING ELECTRON-MICROSCOPE ANALYSIS OF FRACTURE CROSS-SECTIONS IN INTEGRATED-CIRCUITS PROCESS CHARACTERIZATION SCANNING ELECTRON MICROSCOPY, 1983, : 1585 - 1593