TESTING OF BUBBLE MEMORY DEVICES

被引：0

作者：

IWASA, S

KANEKO, Y

NOGIWA, K

机构：

来源：

FUJITSU SCIENTIFIC & TECHNICAL JOURNAL | 1979年 / 15卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：65 / 83

页数：19

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