TESTING OF BUBBLE MEMORY DEVICES

被引：0
|
作者：
IWASA, S
KANEKO, Y
NOGIWA, K
机构：
来源：
FUJITSU SCIENTIFIC & TECHNICAL JOURNAL | 1979年 / 15卷 / 02期
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：65 / 83
页数：19
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