TESTING OF BUBBLE MEMORY DEVICES

被引：0

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作者：

IWASA, S

KANEKO, Y

NOGIWA, K

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来源：

FUJITSU SCIENTIFIC & TECHNICAL JOURNAL | 1979年 / 15卷 / 02期

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TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：65 / 83

页数：19

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