SECONDARY ION MASS-SPECTROMETRY (SIMS), A NEW METHOD FOR ANALYSIS OF SOLIDS

被引：0

|

作者：

MAUL, J ^{[1
]}

FLUCKIGER, U ^{[1
]}

机构：

[1] EIDGENOSS INST REAKTORFORSCH,CH-5303 WURENLINGEN,SWITZERLAND

来源：

KERNTECHNIK | 1978年 / 20卷 / 10期

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D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

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页码：467 / 470

页数：4

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