SECONDARY ION MASS-SPECTROMETRY (SIMS), A NEW METHOD FOR ANALYSIS OF SOLIDS

被引：0
|
作者：
MAUL, J [1 ]
FLUCKIGER, U [1 ]
机构：
[1] EIDGENOSS INST REAKTORFORSCH,CH-5303 WURENLINGEN,SWITZERLAND
来源：
KERNTECHNIK | 1978年 / 20卷 / 10期
关键词：
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：467 / 470
页数：4
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