IMPROVEMENT OF CRYSTALLINE QUALITY OF EPITAXIAL SI LAYERS BY ION-IMPLANTATION TECHNIQUES

被引:86
|
作者
LAU, SS
MATTESON, S
MAYER, JW
REVESZ, P
GYULAI, J
ROTH, J
SIGMON, TW
CASS, T
机构
[1] CENT RES INST PHYS,H-1525 BUDAPEST,HUNGARY
[2] MAX PLANCK INST PLASMA PHYS,D-8046 GARCHING,FED REP GER
[3] STANFORD UNIV,STANFORD,CA 94305
[4] HEWLETT PACKARD CO,IC LAB,PALO ALTO,CA 94304
关键词
D O I
10.1063/1.90564
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:76 / 78
页数:3
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