共 50 条
- [36] Low energy proton induced single event upset in 65 nm DDR and QDR commercial SRAMs NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 406 : 443 - 448
- [37] Error Rate Prediction of Low Energy Proton Induced Single Event Upset for 65 nm SRAM Yuanzineng Kexue Jishu/Atomic Energy Science and Technology, 2019, 53 (02): : 366 - 372
- [38] Single event upset modeling with nuclear reactions in nanoscale electronics MIXDES 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2008, : 443 - +
- [39] Computational method to estimate Single Event Upset rates in an accelerator environment NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 450 (01): : 155 - 172