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- [41] ELLIPSOMETRY - A METHOD FOR THE CHARACTERIZATION OF THIN-FILMS BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1981, 85 (10): : 847 - 851
- [42] METHOD FOR MEASURING THE OPTICAL-PROPERTIES OF SLIGHTLY ABSORBING, INHOMOGENEOUS DIELECTRIC THIN-FILMS JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (13): : P40 - P40
- [43] EVALUATION OF THE SHAMIR-GRAFF METHOD FOR MEASURING OPTICAL-CONSTANTS OF THIN-FILMS APPLIED OPTICS, 1979, 18 (20): : 3367 - 3368
- [45] TECHNIQUE FOR MEASURING THE ELEMENTARY PINNING FORCE IN THIN-FILMS PHYSICAL REVIEW B, 1989, 39 (04): : 2054 - 2059
- [46] MODIFICATIONS IN ABELES METHOD FOR MEASURING INDEX OF REFRACTION ON THIN-FILMS IN INTEGRATED-OPTICS ALTA FREQUENZA, 1977, 46 (05): : 238 - 244
- [47] INSTRUMENT FOR MEASURING SWITCHING TRANSITION IN FERROELECTRIC THIN-FILMS REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (12): : 1719 - 1720
- [48] 3 METHODS FOR MEASURING THE ULTRASONIC VELOCITY IN THIN-FILMS MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1990, 126 : 149 - 154