NEW METHOD FOR MEASURING PERMITTIVITY OF THIN-FILMS

被引：0
|
作者：
BEDNARCZYK, J [1 ]
PIECH, T [1 ]
PISARKIEWICZ, T [1 ]
WEGRZYN, A [1 ]
机构：
[1] ACAD MIN & MET,LAB SOLID STATE PHYS,MICKIEWICZA 30,30-059 CRACOW,POLAND
来源：
ACTA PHYSICA POLONICA A | 1975年 / A 47卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：171 / 175
页数：5
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