NEW METHOD FOR MEASURING PERMITTIVITY OF THIN-FILMS

被引：0

作者：

BEDNARCZYK, J ^{[1
]}

PIECH, T ^{[1
]}

PISARKIEWICZ, T ^{[1
]}

WEGRZYN, A ^{[1
]}

机构：

[1] ACAD MIN & MET,LAB SOLID STATE PHYS,MICKIEWICZA 30,30-059 CRACOW,POLAND

来源：

ACTA PHYSICA POLONICA A | 1975年 / A 47卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：171 / 175

页数：5

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