X-RAY TOPOGRAPHIC DEFECTS CONTRAST ON SYNTHETIC QUARTZ

In the present study the linear defects in several synthetic quartz have been surveyed by X-rav topography using Lang method. The grown-in dislocations produced by layers displacement around holes, precipitates or inclusions are discussed. Each growth zone is described with their own defects pattern and some correlations with the external morphology of the crystal are stated. There are also pointed out the asymmetry of the defects for every growth zone and the specific role in the growth mechanism of the s-growth zone. In the final part of the work there are outlined the general and the specific conclusions.