LOT UNIFORMITY AND SMALL SAMPLE SIZES IN HARDNESS ASSURANCE

被引：15

作者：

NAMENSON, A

机构：

[1] US Naval Research Lab, Washington,, DC, USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

Failure Analysis - Quality Assurance - Standards;

D O I：

10.1109/23.25488

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Recent standard radiation test procedures allow wafer-level lot acceptance testing using as few as two or four parts with no failures. Such tests guarantee a high survivability of the accepted part only when the parts within a wafer exhibit a highly uniform response to radiation and when a large fraction of the wafers pass the test. The author points out the need for validating these tests, suggests techniques for doing so, and recommends modifications to current test procedures.

引用

页码：1506 / 1511

页数：6

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