共 50 条
- [21] How burn-in can reduce quality and reliability INSTITUTE OF ENVIRONMENTAL SCIENCES 1996 PROCEEDINGS - PRODUCT RELIABILITY DESIGN, TEST, AND EVALUATION, 1996, : 16 - 19
- [23] CMOS IC reliability indicators and burn-in economics INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, : 194 - 203
- [24] EFFECT OF ENDLESS BURN-IN ON RELIABILITY GROWTH PROJECTIONS PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 1979, (NSYM): : 392 - 397
- [25] Observations on Component Infant Mortality and Burn-In Effectiveness IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2008, 31 (04): : 914 - 916
- [27] Novel Magnetic Burn-In for Retention Testing of STTRAM PROCEEDINGS OF THE 2017 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2017, : 666 - 669
- [28] MONITORED BURN-IN IMPROVES VLSI IC RELIABILITY. Electronic Systems Technology and Design/Computer Design's, 1985, 25 (04): : 143 - 144
- [29] Evaluation of effectiveness of median of absolute deviations outlier rejection-based IDDQ testing for burn-in reduction 20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2002, : 81 - 86
- [30] Comments on "Observations on Component Infant Mortality and Burn-In Effectiveness" IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2009, 32 (02): : 521 - 522