Evaluation of effectiveness of median of absolute deviations outlier rejection-based IDDQ testing for burn-in reduction

被引：22

作者：

Sabade, SS ^{[1
]}

Walker, DM ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Comp Sci, College Stn, TX 77843 USA

来源：

20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2002年

关键词：

D O I：

10.1109/VTS.2002.1011115

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

CMOS chips having high leakage are observed to have high burn-in fallout rate. I-DDQ testing has been considered as an alternative to burn-in. However, increased subthreshold leakage current in deep sub-micron technologies limits the use of I-DDQ testing in its present form. In this work, a statistical outlier rejection technique known as the median of absolute deviations (MAD) is evaluated as a means to screen early failures using I-DDQ data. MAD is compared with delta I-DDQ and current signature methods. The results of the analysis of the SEMATECH data are presented.

引用

页码：81 / 86

页数：6