LIGHT AND CURRENT DEGRADATION OF A-SI-H PIN, NIN AND PIP DIODES DETECTED WITH CPM

被引：0
|
作者：
OSTENDORF, HC [1 ]
KUSIAN, W [1 ]
KRUHLER, W [1 ]
SCHWARZ, R [1 ]
机构：
[1] SIEMENS AG,CORP RES & DEV,MUNICH,GERMANY
来源：
JOURNAL OF NON-CRYSTALLINE SOLIDS | 1993年 / 166卷
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Light and current degradation of nin, pip and pin diodes were investigated using CPM and SCLC. We found that degradation can be induced by recombination as well as by hole injection. Excess electrons do not cause any degradation.
引用
收藏
页码：659 / 662
页数：4
相关论文
共 50 条
  • [1] Light and current degradation of a-Si:H pin, nin and pip diodes detected with CPM
    Ostendorf, H.C.
    Kusian, W.
    Kruhler, W.
    Schwarz, R.
    Journal of Non-Crystalline Solids, 1993, 164-66 (pt 2) : 659 - 662
  • [2] QUALITY FACTOR IN A-SI-H NIP AND PIN DIODES
    VANBERKEL, C
    POWELL, MJ
    FRANKLIN, AR
    FRENCH, ID
    JOURNAL OF APPLIED PHYSICS, 1993, 73 (10) : 5264 - 5268
  • [3] CPM MEASUREMENTS ON A-SI-H BASED PIN CELLS - A CRITICAL INVESTIGATION
    GEYER, R
    GORN, M
    KNIFFLER, N
    LECHNER, P
    RUBEL, H
    SCHEPPAT, B
    CONFERENCE RECORD OF THE TWENTIETH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1988, VOLS 1-2, 1988, : 340 - 345
  • [4] A 2-DIMENSIONAL IMAGE SENSOR WITH A-SI-H PIN DIODES
    MIMURA, H
    SAI, K
    OHTA, Y
    YAMAMOTO, K
    KITAMURA, K
    APPLIED SURFACE SCIENCE, 1991, 48-9 : 521 - 525
  • [5] PHOTOINDUCED DEGRADATION OF ALPHA-SI-H DIODES WITH AN NIN STRUCTURE
    PFLEIDERER, H
    KUSIAN, W
    KRUHLER, W
    SOLID STATE COMMUNICATIONS, 1984, 49 (05) : 493 - 495
  • [6] LIGHT AND TEMPERATURE EFFECT ON PIN A-SI-H DEVICE PERFORMANCE
    VIEIRA, M
    FORTUNATO, E
    LAVAREDA, G
    CARVALHO, CN
    MARTINS, R
    VACUUM, 1994, 45 (10-11) : 1147 - 1149
  • [7] A-SI-H/MU-C-SIC-H PIN DIODES FOR IMAGING DEVICES
    MIMURA, H
    KATSUNO, M
    FUTAGI, T
    OHTANI, N
    OHTA, Y
    KITAMURA, K
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1992, (121): : 371 - 376
  • [8] LIGHT-SCATTERING EFFECTS IN CPM AND PDS MEASUREMENT ON A-SI-H FILMS
    FAVRE, M
    CURTINS, H
    VANECEK, M
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1989, 114 : 405 - 407
  • [9] SUBBANDGAP ABSORPTION IN A-SI-H PIN CELLS ILLUMINATED WITH INFRARED LIGHT
    RUBEL, H
    FRAMMELSBERGER, W
    LECHNER, P
    KNIFFLER, N
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 : 1169 - 1172
  • [10] CPM MEASUREMENTS ON A-SI-H BASED PIN SOLAR-CELLS - THICKNESS AND BIAS VOLTAGE EFFECTS
    RUBEL, H
    GORN, M
    SCHEPPAT, B
    GEYER, R
    LECHNER, P
    KNIFFLER, N
    AMORPHOUS SILICON TECHNOLOGY - 1989, 1989, 149 : 465 - 470
12345