COMPARISON BETWEEN BRIGHT-FIELD AND DARK-FIELD STEM IMAGINGS BASED ON SIGNAL-TO-NOISE RATIO CALCULATIONS

被引：0

作者：

SUGIYAMA, S ^{[1
]}

HAYASHI, I ^{[1
]}

HIBINO, M ^{[1
]}

机构：

[1] NAGOYA UNIV,FAC ENGN,DEPT ELECTRON,CHIKUSA KU,NAGOYA,AICHI 464,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1984年 / 33卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：285 / 285

页数：1

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