ELECTRON MICROSCOPY OF THIN TWINS AND STACKING FAULTS

被引：11

|

作者：

FUJITA, H

KAWASAKI, Y

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1966年 / 5卷 / 09期

关键词：

D O I：

10.1143/JJAP.5.788

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：788 / &

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