SECONDARY ION MASS-SPECTROMETRY BY TIME-OF-FLIGHT

被引：28

|

作者：

STANDING, KG

BEAVIS, R

ENS, W

SCHUELER, B

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 53卷 / SEP期

关键词：

D O I：

10.1016/0020-7381(83)85107-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

收藏

页码：125 / 134

页数：10

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