SECONDARY ION MASS-SPECTROMETRY BY TIME-OF-FLIGHT

被引：28
|
作者：
STANDING, KG
BEAVIS, R
ENS, W
SCHUELER, B
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 53卷 / SEP期
关键词：
D O I：
10.1016/0020-7381(83)85107-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：125 / 134
页数：10
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