SECONDARY ION MASS-SPECTROMETRY BY TIME-OF-FLIGHT

被引：28
|
作者：
STANDING, KG
BEAVIS, R
ENS, W
SCHUELER, B
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 53卷 / SEP期
关键词：
D O I：
10.1016/0020-7381(83)85107-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：125 / 134
页数：10
相关论文
共 50 条
  • [1] LIQUID SECONDARY ION TIME-OF-FLIGHT MASS-SPECTROMETRY
    OLTHOFF, JK
    HONOVICH, JP
    COTTER, RJ
    ANALYTICAL CHEMISTRY, 1987, 59 (07) : 999 - 1002
  • [2] LIQUID SECONDARY ION TIME-OF-FLIGHT MASS-SPECTROMETRY
    COTTER, RJ
    ANALYTICAL CHEMISTRY, 1984, 56 (13) : 2594 - 2596
  • [3] TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY OF POLYBUTADIENES
    HITTLE, LR
    HERCULES, DM
    SURFACE AND INTERFACE ANALYSIS, 1994, 21 (04) : 217 - 225
  • [4] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF PERFLUORINATED POLYETHERS
    BLETSOS, IV
    HERCULES, DM
    FOWLER, D
    VANLEYEN, D
    BENNINGHOVEN, A
    ANALYTICAL CHEMISTRY, 1990, 62 (13) : 1275 - 1284
  • [5] MICROSCOPE IMAGING BY TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY
    SCHUELER, BW
    MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1992, 3 (2-3): : 119 - 139
  • [6] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF PERFLUORINATED POLYETHERS
    BLETSOS, IV
    HERCULES, DM
    FOWLER, D
    VANLEYEN, D
    BENNINGHOVEN, A
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 200 : 7 - FLUO
  • [7] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMER MATERIALS
    VANLEYEN, D
    HAGENHOFF, B
    NIEHUIS, E
    BENNINGHOVEN, A
    BLETSS, IV
    HERCULES, DM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1790 - 1794
  • [8] QUANTITATIVE TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF A PERFLUORINATED POLYETHER
    FOWLER, DE
    JOHNSON, RD
    VANLEYEN, D
    BENNINGHOVEN, A
    SURFACE AND INTERFACE ANALYSIS, 1991, 17 (03) : 125 - 136
  • [9] THE CHARACTERIZATION OF AN IMAGING TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY INSTRUMENT
    ECCLES, AJ
    VICKERMAN, JC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (02): : 234 - 244
  • [10] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLY(ALKYL METHACRYLATES)
    ZIMMERMAN, PA
    HERCULES, DM
    BENNINGHOVEN, A
    ANALYTICAL CHEMISTRY, 1993, 65 (08) : 983 - 991
12345