EVALUATION OF THE PRECISION OF ELECTRON-DENSITY AND ELECTROSTATIC POTENTIAL FROM X-RAY-DIFFRACTION DATA

被引：0
|
作者：
LOBANOV, NN
TSIRELSON, VG
SHCHEDRIN, BM
机构：
[1] MV LOMONOSOV STATE UNIV,MOSCOW 117234,USSR
[2] DI MENDELEEV CHEM TECHNOL INST,MOSCOW,USSR
来源：
KRISTALLOGRAFIYA | 1990年 / 35卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：589 / 595
页数：7
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