EVALUATION OF THE PRECISION OF ELECTRON-DENSITY AND ELECTROSTATIC POTENTIAL FROM X-RAY-DIFFRACTION DATA

被引：0

作者：

LOBANOV, NN

TSIRELSON, VG

SHCHEDRIN, BM

机构：

[1] MV LOMONOSOV STATE UNIV,MOSCOW 117234,USSR

[2] DI MENDELEEV CHEM TECHNOL INST,MOSCOW,USSR

来源：

KRISTALLOGRAFIYA | 1990年 / 35卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：589 / 595

页数：7

共 50 条

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