ELECTRON-SPIN-RESONANCE STUDIES OF ELECTRON-TRANSPORT ACROSS THE METAL-SILICON INTERFACE

被引：1
|
作者：
VIER, DC
SCHULTZ, S
WU, MG
MAPLE, MB
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.583831
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：985 / 986
页数：2
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