ELECTRON-SPIN-RESONANCE STUDIES OF ELECTRON-TRANSPORT ACROSS THE METAL-SILICON INTERFACE

被引：1

|

作者：

VIER, DC

SCHULTZ, S

WU, MG

MAPLE, MB

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.583831

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：985 / 986

页数：2

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