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CHARACTERIZATION OF SILICON-COMPOUNDS USING THE AUGER PARAMETER IN X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS)
被引:29
|
作者
:
KOHIKI, S
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
KOHIKI, S
[
1
]
OZAKI, S
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
OZAKI, S
[
1
]
HAMADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
HAMADA, T
[
1
]
TANIGUCHI, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
TANIGUCHI, K
[
1
]
机构
:
[1]
OSAKA ELECTROCOMMUN UNIV,DEPT SOLID STATE ELECTR,NEYAGAWA,OSAKA 572,JAPAN
来源
:
APPLIED SURFACE SCIENCE
|
1987年
/ 28卷
/ 02期
关键词
:
D O I
:
10.1016/0169-4332(87)90057-2
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:103 / 110
页数:8
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