GROUP-DELAY MEASUREMENT USING THE FOURIER-TRANSFORM OF AN INTERFEROMETRIC CROSS-CORRELATION GENERATED BY WHITE-LIGHT

被引:141
|
作者
NAGANUMA, K
MOGI, K
YAMADA, H
机构
[1] NTT Opto-electronics Laboratories, Atsugi-shi, Kanagawa, 243-01
关键词
D O I
10.1364/OL.15.000393
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new method and apparatus for measuring the group delay in optical components and laser cavities are described. Cross-correlational fringes are fully recorded with a Michelson interferometer, in one of whose arms the optics to be measured are inserted. The path difference of the interferometer is calibrated to subwavelength accuracy, and the group delay is calculated from the phase of the Fourier transform of the measured fringe. The group delay for the entire visible-wavelength region is evaluated after a single measurement in approximately 10 min, using white light. © 1990 Optical Society of America.
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页码:393 / 395
页数:3
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